TEM (FEI Titan 80-300)
Transmission Electron Microscope (FEI Titan 80-300)
Specifications
- Acceleration voltage: 80 - 300 kV
- S-Twin objective lens
- No probe / objective corrector
- Gatan US1000P camera
- STEM detector
- Retractable EDX detector
- CompuStage low-background double-tilt holder
- Probe current in 1 nm spot: > 0.6 nA
- Probe current in 2 nm sport: > 3 nA
- Maximum spot drift: < 0.5 nm/min
- Maximum speciment drift: < 0.5 nm/min
- Resolution (all data for 300 kV)
- Point resolution: 0.2 nm
- Line resolution: < 0.1 nm
- Information limit: < 0.1 nm
- HAAD-STEM resolution: 0.136 nm - Si (110) dumbells can be resolved
- Info limit with Lorentz lens: 1.3 nm
- Point resolution with Lorentz lens: 2.0 nm
- EDX energy resolution: 133 eV Flexible high tension from 80 to 300 kV
Location
- Microstructure laboratory
